ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,104, issued on Nov. 3, was assigned to FORWARD ELECTRONICS Co. LTD. (Taipei City, Taiwan). "Encoder with light emitting diode" was invented ... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,105, issued on Nov. 3, was assigned to Festo SE & Co. KG (Esslingen, Germany). "Method and device for determining a piston or wheel position... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,106, issued on Nov. 3, was assigned to SEIKO EPSON Corp. (Japan). "Laser interferometer" was invented by Jun Kitagawa (Matsumoto, Japan) and... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,107, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor measurement device" was invented... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,108, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measurement apparatus" was inven... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,109, issued on Nov. 3, was assigned to Munro Design & Technologies LLC (Ontario, N.Y.). "Reflective co-axial interferometer systems and meth... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,110, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measuring device using beam disp... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,111, issued on Nov. 3, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Metrology device with wavelength-frequency multiplexing" w... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,112, issued on Nov. 3, was assigned to NIKON Corp. (Tokyo). "Position-measuring device, position-measuring system, and measuring device" was... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,113, issued on Nov. 3, was assigned to MITUTOYO Corp. (Kanagawa, Japan). "Coordinate measuring machine and in-line measurement system" was i... Read More